Data storage using read-mask-write operation

ABSTRACT

Method and apparatus for writing data to a storage array, such as but not limited to an STRAM or RRAM memory array, using a read-mask-write operation. In accordance with various embodiments, a first bit pattern stored in a plurality of memory cells is read. A second bit pattern is stored to the plurality of memory cells by applying a mask to selectively write only those cells of said plurality corresponding to different bit values between the first and second bit patterns.

BACKGROUND

Data storage devices generally operate to store and retrieve data in a fast and efficient manner. Some storage devices utilize a semiconductor array of solid-state memory cells to store individual bits of data. Such memory cells can be volatile (e.g., DRAM, SRAM) or non-volatile (RRAM, STRAM, flash, etc.).

As will be appreciated, volatile memory cells generally retain data stored in memory only so long as operational power continues to be supplied to the device, while non-volatile memory cells generally retain data storage in memory even in the absence of the application of operational power.

In these and other types of data storage devices, it is often desirable to reduce power consumption requirements during operation, particularly with regard to the power required to write data to the storage array.

SUMMARY

Various embodiments of the present invention are generally directed to a method and apparatus for writing data to a storage array, such as but not limited to an STRAM or RRAM memory array, using a read-mask-write operation.

In accordance with some embodiments, the method generally comprises reading a first bit pattern stored in a plurality of memory cells, and then storing a second bit pattern to the plurality of memory cells by applying a mask to selectively write only those cells of said plurality corresponding to different bit values between the first and second bit patterns.

In accordance with other embodiments, the apparatus generally comprises a memory array comprising a plurality of memory cells, and a control circuit configured to read a first bit pattern stored in the plurality of memory cells, and to store a second bit pattern to the plurality of memory cells by applying a mask to selectively write only those cells of said plurality corresponding to different bit values between the first and second bit patterns.

These and various other features and advantages which characterize the various embodiments of the present invention can be understood in view of the following detailed discussion and the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a generalized functional representation of an exemplary data storage device constructed and operated in accordance with various embodiments of the present invention.

FIG. 2 shows circuitry used to read data from and write data to a memory array of the device of FIG. 1.

FIG. 3 generally illustrates a manner in which data are written to a memory cell of the memory array.

FIG. 4 generally illustrates a manner in which data are read from the memory cell of FIG. 3.

FIG. 5 shows a write data mask generated in accordance with various embodiments of the present invention.

FIG. 6 sets forth a READ-MASK-WRITE OPERATION routine generally illustrative of steps carried out in accordance with various embodiments of the present invention to write data to a memory array.

FIG. 7 shows circuitry used to prefetch read data during a write operation in accordance with various embodiments of the present invention.

DETAILED DESCRIPTION

FIG. 1 provides a functional block representation of a data storage device 100 constructed and operated in accordance with various embodiments of the present invention. The data storage device is contemplated as comprising a portable non-volatile memory storage device such as a PCMCIA card or USB-style external memory device. It will be appreciated, however, that such characterization of the device 100 is merely for purposes of illustrating an exemplary embodiment and is not limiting to the claimed subject matter.

Top level control of the device 100 is carried out by a suitable controller 102, which may be a programmable or hardware based microcontroller. The controller 102 communicates with a host device via a controller interface (I/F) circuit 104 and a host I/F circuit 106. Local storage of requisite commands, programming, operational data, etc. is provided via random access memory (RAM) 108 and read-only memory (ROM) 110. A buffer 112 can be used as desired to temporarily store input write data from the host device and readback data pending transfer to the host device. The buffer can be a separate portion of the device, or can be incorporated into the memory space 114.

A memory space is shown at 114 to comprise a number of memory arrays 116 (denoted Array 0-N), although it will be appreciated that a single array can be utilized as desired. Each array 116 comprises a block of semiconductor memory of selected storage capacity. Communications between the controller 102 and the memory space 114 are coordinated via a memory (MEM) I/F 118. As desired, on-the-fly error detection and correction (EDC) encoding and decoding operations are carried out during data transfers by way of an EDC block 120.

While not limiting, in some embodiments the various circuits depicted in FIG. 1 are arranged as a single chip set formed on one or more semiconductor dies with suitable encapsulation, housing and interconnection features (not separately shown for purposes of clarity). Input power to operate the device is handled by a suitable power management circuit 122 and is supplied from a suitable source such as from a battery, AC power input, etc. Power can also be supplied to the device 100 directly from the host such as through the use of a USB-style interface, etc.

Any number of data storage and transfer protocols can be utilized, such as logical block addressing (LBAs) whereby data are arranged and stored in fixed-size blocks (such as 512 bytes of user data plus overhead bytes for ECC, sparing, header information, etc). Host commands can be issued in terms of LBAs, and the device 100 can carry out a corresponding LBA-to-PBA (physical block address) conversion to identify and service the associated locations at which the data are to be stored or retrieved.

FIG. 2 provides a generalized representation of selected aspects of the memory space 114 of FIG. 1. Data are stored as an arrangement of rows and columns of memory cells 124, accessible by various row (word) and column (bit) lines, etc. In some embodiments, each of the array memory cells 124 has a spin-torque transfer random access memory (STTRAM or STRAM) configuration. However, it will be appreciated that such is not limiting, in that any number of different types of non-volatile or volatile memory cell constructions can be utilized, including but not limited to resistive RAM (RRAM), magnetoresistive RAM (MRAM), zero-capacitor RAM (ZRAM), static RAM (SRAM), non-volatile static RAM (nvSRAM), ferroelectric RAM (FeRAM), nano RAM (NRAM), phase-change RAM (PRAM), EEPROM, flash, dynamic RAM (DRAM), etc.

Control logic 126 receives and transfers data, addressing information and control/status values along multi-line bus paths 128, 130 and 132, respectively. X and Y decoding circuitry 134, 136 provide appropriate switching and other functions to access the appropriate cells 124. A write circuit 138 represents circuitry elements that operate to carry out write operations to write data to the cells 124, and a read circuit 140 correspondingly operates to obtain readback data from the cells 124. Local buffering of transferred data and other values can be provided via one or more local registers 144. At this point it will be appreciated that the circuitry of FIG. 2 is merely exemplary in nature, and any number of alternative configurations can readily be employed as desired depending on the requirements of a given application.

Data are written to the respective memory cells 124 as generally depicted in FIG. 3. Generally, a write power source 146 applies the necessary input (such as in the form of current, voltage, magnetization, etc.) to configure the memory cell 124 to a desired state. It can be appreciated that FIG. 3 is merely a representative illustration of a bit write operation. The configuration of the write power source 146, memory cell 124, and reference node 148 can be suitably manipulated to allow conventional writing of a bit with a variety of memory devices (such as SRAM, STRAM, RRAM, flash, etc).

As noted above, in some embodiments the memory cell 124 takes an STRAM configuration, in which case the write power source 146 is characterized as a bi-directional current driver connected through a memory cell 124 to a suitable reference node 148, such as ground. The write power source 146 provides a stream of power that is spin polarized by moving through a magnetic material in the memory cell 124. The resulting rotation of the polarized spins creates a torque that changes the magnetic moment of the memory cell 124.

Depending on the orientation of the applied write current, the cell 124 will take either a relatively low resistance (R_(L)) or a relatively high resistance (R_(H)). While not limiting, exemplary R_(L) values may be in the range of about 100 ohms (Ω) or so, whereas exemplary R_(H) values may be in the range of about 100KΩ or so Other resistive memory type configurations (e.g., RRAMS) are supplied with a suitable voltage or other input to similarly provide respective R_(L) and R_(H) values. These values are retained by the respective cells until such time that the state is changed by a subsequent write operation. While not limiting, in the present example it is contemplated that a high resistance value (R_(H)) denotes storage of a logical 1 by the cell 124, and a low resistance value (R_(L)) denotes storage of a logical 0.

The logical bit value(s) stored by each cell 124 can be determined in a manner such as illustrated by FIG. 4. A read power source 150 applies an appropriate input (e.g., a selected read voltage) to the memory cell 124. The amount of read current I_(R) that flows through the cell 124 will be a function of the resistance of the cell (R_(L) or R_(H), respectively). In the case of STRAM, as well as other types of memory configurations such as RRAM, the read current magnitude will be generally be significantly lower than the write current magnitude utilized to set the storage state of the bit. The voltage drop across the memory cell (voltage V_(MC)) is sensed via path 152 by the positive (+) input of a comparator 154. A suitable reference (such as voltage reference V_(REF)) is supplied to the negative (−) input of the comparator 154 from a reference source 156.

The reference voltage V_(REF) is selected such that the voltage drop V_(MC) across the memory cell 124 will be lower than the V_(REF) value when the resistance of the cell is set to R_(L), and will be higher than the V_(REF) value when the resistance of the cell is set to R_(H). In this way, the output voltage level of the comparator 154 will indicate the logical bit value (0 or 1) stored by the memory cell 124.

FIG. 5 illustrates an exemplary write data mask operation 158 carried out in accordance with an embodiment. The existing bit pattern stored in memory 160 is read and compared to a new bit pattern to be stored in memory 162. The comparison of the new bit pattern 162 in relation to the existing bit pattern 160 is conducted through the operation of an exclusive or (XOR) function 164. It should be noted that various comparison techniques can be employed among numerous bit values to discern the differences between existing and new bit patterns 160 and 162. However, the use of an XOR function 164 results in an output of a 0 for every new bit value that is equivalent to the existing bit value and a 1 for every new bit value that is different than the existing bit value. In this embodiment, the write data mask 158 can be implemented to write only the bit values needed to render the new bit pattern 162 from the existing bit pattern 160.

After the write data mask operation 158 of FIG. 5 compares the existing and new bit patterns, the mask will output a bit pattern indicating which bits differ. The outputted mask bit pattern can be used to set write enable/disable inputs for the respective cells. A mask bit value of 1 indicates the corresponding existing bit needs to be switched, whereas a mask bit pattern bit value of 0 indicates no write process is required for that bit. The advantageous implementation of the write data mask with existing solid state memory requiring switch bit commands can readily be understood due to the ability of the write data mask to reduce the number of bits written by masking certain bits of equivalent values.

It is contemplated that the masking operation may result in bits being written of opposite logical polarity; for example, at least one bit may be changed from a 0 to 1 whereas at least one other bit may be changed from a 1 to a 0 during a given write operation. There is no general limitation to size of bit pattern (e.g. 4-bit, 16-bit, 128-bit, etc.) that can be used, and multiple bits can be stored per cell. The existing and new bit patterns 160, 162 are equal in number of bits, although such is not necessarily required.

An exemplary flow diagram for a READ-MASK-WRITE OPERATION routine 166 is set forth by FIG. 6. New write data D(W) are received at step 168 to be stored to a selected location in memory. Reception of the write data D(W) results in an access operation at step 170 to recover the contents stored at the selected location. While step 170 involves the reading of the plurality of cells in the storage array, alternatively a local buffer, register or other memory location with the same contents as the storage array can be accessed as desired.

A write data mask D(M) is next generated at step 172 in relation to the respective data D(W) and D(R). As noted above, this is carried out in some embodiments using an XOR operation (i.e., D(M)=D(W) XOR D(R)), although other suitable methodologies can be used as desired. The resultant write data mask is utilized at step 174 to write those bits necessary at the selected location such that, at the completion of the data write operation 174, the write data D(W) are stored in the selected location. The routine then returns to step 168 as shown and continues as new write data are presented for storage.

In some embodiments, the device 100 further includes predictive read look ahead circuitry 176 as generally depicted FIG. 7. An address decoder 180 identifies the destination address within the array (in this case, address “0”) associated with received write data DW0. In response, a read block 180 operates to identify the data currently stored at this address (i.e., D(R₀)) in a manner such as set forth above.

An increment circuit 182, such as a counter, identifies the next address (e.g., address N) for the next set of write data D(W_(N)). This new address N may be a prediction of the next address based on previous address sequencing, or may be based on write data that has been physically received by the device 100, such as data pending in buffer 112 (FIG. 1) or some other location (e.g., registers 144 in FIG. 2). A look-ahead read operation is carried out by block 184 to read the corresponding data D(RN) at the look-ahead address. In this way, write efficiencies can be improved by reducing the time required to access the existing data for a given mask generation operation.

It should be noted that the increment block can search various locations or bit pattern sizes to accommodate the most efficient read ahead operation. In an alternative embodiment, the increment block can designate a read operation for non-sequential data. Likewise, a range of bit sectors can be read, written with the write data mask, and concurrently incremented and read. For example, small blocks, such as 8 bits of data, as well as large blocks, such as 512 byte sectors, can undergo the operation of FIGS. 6 and 7. Further, a given read-mask-write operation can be performed on an entire sector at once, or divided into smaller segments to be written sequentially. In this latter case, it will be clearly known which data will need to be read next by utilizing the look ahead ability of the increment block 180.

The various embodiments illustrated herein provide advantages in both time and power savings. The ability to concurrently read data ahead while writing a bit pattern using a write data mask allows more efficient use time spent reading data. Moreover, the writing of the minimum number of bit values necessary to render a new bit pattern associated with the use of the write data mask significantly reduces the power consumption over conventional data write processes. For many solid state data storage devices such as MRAM, STRAM, and RRAM, the power consumption is considerably greater for a write operation than for a read operation. Thus, a minimization of the number of bit values to be written for a given amount of data allows for extensive power savings over conventional data write operations. However, it will be appreciated that the various embodiments discussed herein have numerous potential applications and are not limited to a certain field of electronic media or type of data storage devices.

In various embodiments, the plurality of memory cells are capable of being individually written to without having to reset a block of memory cells and concurrently write said block of memory cells, such as so-called resistive sense memory (RSM) cells which include MRAM, STRAM and RRAM cells. This excludes other types of erasable cells such as EEPROM and flash, which require an erase operation to reset the storage state of the cells prior to a write operation. Moreover, erasable cells can only be written to a single value (e.g., all cells are initially set to logical 0 and then selectively written to 1) whereas RSM cells can be alternatively written from any first state (e.g., logical state 0 or 1) to a second state (e.g., logical state 1 or 0).

It is to be understood that even though numerous characteristics and advantages of various embodiments of the present invention have been set forth in the foregoing description, together with details of the structure and function of various embodiments of the invention, this detailed description is illustrative only, and changes may be made in detail, especially in matters of structure and arrangements of parts within the principles of the present invention to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed. 

1. A method comprising: reading a first bit pattern stored in a plurality of memory cells; and overwriting a second bit pattern to the plurality of memory cells by applying a mask to selectively write only those cells of said plurality corresponding to different logical bit values between the first and second bit patterns.
 2. The method of claim 1, wherein the reading step comprises accessing the plurality of memory cells to retrieve the first bit pattern.
 3. The method of claim 1, wherein the reading step comprises reading a buffer to retrieve the first bit pattern, wherein the buffer and the plurality of memory cells each respectively stores the first bit pattern.
 4. The method of claim 1, wherein the storing overwriting step comprises generating the mask in relation to the first bit pattern and the second bit pattern.
 5. The method of claim 1, further comprising applying an exclusive-or (XOR) function between the first bit pattern and the second bit pattern to generate the mask.
 6. The method of claim 1, wherein the overwriting step comprises changing a state of at least a first one of said plurality of cells to store a logical 0 and changing a state of at least a second one of said plurality of cells to store a logical
 1. 7. The method of claim 1, wherein the plurality of memory cells are each characterized as a spin-torque transfer random access memory (STRAM) cell.
 8. The method of claim 1, wherein the plurality of memory cells are each characterized as a resistive random access memory (RRAM) cell.
 9. The method of claim 1, wherein a read ahead operation is conducted concurrently with the application of the mask.
 10. The method of claim 9, wherein the read ahead operation is conducted for the next sequential address of data.
 11. An apparatus, comprising: a memory array comprising a plurality of memory cells; and a control circuit configured to read a first bit pattern stored in the plurality of memory cells, compare the first bit pattern to a different, second bit pattern, and overwrite a portion of said cells of said plurality corresponding to different logical bit values between the first and second bit patterns, wherein a remainder of said cells of said plurality having the same logical bit values between the first and second bit patterns are not overwritten.
 12. The apparatus of claim 11, wherein the control circuit reads a buffer to retrieve the first bit pattern, wherein the buffer and the plurality of memory cells each respectively stores the first bit pattern.
 13. The apparatus of claim 11, wherein the control circuit generates a bit mask in relation to the first bit pattern and the second bit pattern and switches a storage state of selected cells of said plurality identified by said mask.
 14. The apparatus of claim 13, wherein the control circuit generates the mask through the application of an exclusive-or (XOR) function between the first bit pattern and the second bit pattern.
 15. The apparatus of claim 11, wherein the control circuit changes a state of at least a first one of said plurality of cells to store a logical 0, changes a state of at least a second one of said plurality of cells to store a logical 1, and leaves at least a third one of said plurality of cells in an unchanged state.
 16. The apparatus of claim 11, wherein the plurality of memory cells are characterized as resistive sense memory (RSM) cells.
 17. The apparatus of claim 16, wherein the plurality of memory cells are each characterized as a spin-torque transfer random access memory (STRAM) cell.
 18. The apparatus of claim 16, wherein the plurality of memory cells are each characterized as a resistive random access memory (RRAM) cell.
 19. The apparatus of claim 12, wherein the control circuit conducts a read ahead operation concurrently with the application of the mask.
 20. The apparatus of claim 19, wherein the read ahead operation is conducted for the next sequential address of data. 